- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for testing the alignment of axes
Patent holdings for IPC class G01B 11/26
Total number of patents in this class: 1535
10-year publication summary
|
121
|
111
|
116
|
153
|
169
|
126
|
117
|
109
|
85
|
24
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Enplas Corporation | 900 |
25 |
| Sony Corporation | 32931 |
20 |
| The Boeing Company | 19843 |
20 |
| ASML Netherlands B.V. | 6816 |
20 |
| Nikon Corporation | 7162 |
19 |
| Kabushiki Kaisha Topcon | 614 |
18 |
| Canon Kabushiki Kaisha | 6884 |
18 |
| Robert Bosch GmbH | 40953 |
17 |
| Leica Geosystems AG | 658 |
17 |
| Canon Inc. | 36841 |
15 |
| NEC Corporation | 32703 |
13 |
| Denso Corporation | 23338 |
13 |
| Ford Global Technologies, LLC | 19702 |
13 |
| Topcon Corporation | 979 |
13 |
| Olympus Corporation | 13667 |
12 |
| FARO Technologies, Inc. | 786 |
12 |
| Omron Corporation | 6968 |
11 |
| National Institute of Advanced Industrial Science and Technology | 3677 |
11 |
| Trimble Navigation Limited | 701 |
11 |
| Hunter Engineering Company | 272 |
11 |
| Other owners | 1226 |